Ceramography: Preparation and Analysis of Ceramic MicrostructuresCeramography provides detailed instructions on how to saw, mount, grind, polish, etch, examine, interpret and measure ceramic microstructures. This new book includes an atlas of ceramic microstructures, quantitative microstructural example problems with solutions, properties and data tables specific to ceramic microstructures, more than 100 original photographs and illustrations, and numerous practical tips and tricks of the trade. An excellent reference guide for technicians in quality control and R&D, process engineers in ceramic manufacturing, and their counterparts in engineering firms, national laboratories, research institutes, and universities. |
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Page 84
... Depth of Field The depth of field is the distance along the optical axis over which image details are in focus with acceptable clarity . The depth of field varies more or less inversely with resolution and magnification in a microscope ...
... Depth of Field The depth of field is the distance along the optical axis over which image details are in focus with acceptable clarity . The depth of field varies more or less inversely with resolution and magnification in a microscope ...
Page 85
... depth differences between adjacent features for contrast . A for- mula for estimation of the depth of field of a microscope is given by Eq 6 : de = λVn2 - NA2 NA2 ( Eq 6 ) where d is the depth of field , and λ , η , and NA are the same ...
... depth differences between adjacent features for contrast . A for- mula for estimation of the depth of field of a microscope is given by Eq 6 : de = λVn2 - NA2 NA2 ( Eq 6 ) where d is the depth of field , and λ , η , and NA are the same ...
Page 108
... depth in the specimen . The depth of pene- tration is limited by the attenuation ( damping and scattering ) of the ultra- sonic beam by the material , the focal length of the lens , and refraction of the beam . The image in a C - SAM is ...
... depth in the specimen . The depth of pene- tration is limited by the attenuation ( damping and scattering ) of the ultra- sonic beam by the material , the focal length of the lens , and refraction of the beam . The image in a C - SAM is ...
Contents
Ceramic Fabrication | 9 |
Sawing and Mounting | 19 |
Grinding and Polishing | 35 |
Copyright | |
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Ceramography: Preparation and Analysis of Ceramic Microstructures Richard E. Chinn Limited preview - 2002 |
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abrasive acid acoustic Al2O alumina analysis applied approximately ASTM beam binary carbide ceramics ceramographic Chapter clean coating color composition compression contain contrast crack crystal described diameter diamond direction edge electric electron electron microscope Engineered equipment field fracture furnace glass grain boundaries grain size gray levels grinding Handbook hardness heat illumination image analyzer indentation interference layer length lens less light liquid load magnification Materials mean measurement Metallographic Metals method microscope microstructure mold mounting objects optical original particles phase polarized polishing pores porosity Practice preparation pressure procedures properties reflected refractive relief removed require resin Scanning shape shown in Fig Silicon sintering slide Source specimen sputter stage standard step structure Subroutine surface Table Testing thermally etched thin section TiO2 tion toughness transmitted USA Telephone usually viewed volume