Transmission Electron Microscopy: A Textbook for Materials ScienceElectron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively. |
Contents
6 | |
Chapter Preview | 32 |
Beam Damage | 50 |
Pumps and Holders | 117 |
Chapter Summary | 177 |
Thinking in Reciprocal Space | 191 |
14 | 215 |
Diffraction from Crystals | 289 |
Chapter Preview | 379 |
394 | 439 |
CHAPTER PREVIEW | 500 |
ley Moodie and their coworkers principally at Melbourne and Arizona State University ASU in a series | 507 |
Qualitative Xray Analysis | 587 |
Microanalysis | 599 |
CHAPTER PREVIEW | 621 |
38 | 653 |
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Common terms and phrases
amplitude analysis angle astigmatism atoms Bloch waves Bragg Bragg angle Bragg condition Bragg's Law bremsstrahlung C2 aperture CBED patterns Chapter contrast cross section crystal defects define detector determine DF image diagram diffracted beam diffraction pattern direct beam discuss disk dislocations dispersion surface edge EELS effect elastic scattering elec electron beam Electron Microscopy energy energy-loss equation Ewald sphere experimental film foil fringes give holder HOLZ lines HRTEM incident beam intensity interface ionization Kikuchi lines lenses magnification materials measure microanalysis objective aperture objective lens optic axis parallel parameter peak phase plasmon point group pump reciprocal lattice reciprocal space reflections region relrod rotation SAD pattern scanning screen shown in Figure simulation space spectrometer spectrum spots STEM image structure symmetry technique thickness thin specimen tilt tion trons unit cell vacuum vector voltage X-ray XEDS ZOLZ