Transmission Electron Microscopy: A Textbook for Materials Science

Front Cover
Springer Science & Business Media, Mar 9, 2013 - Science - 729 pages
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
 

Contents

and Resolution
6
Chapter Preview
32
Beam Damage
50
Pumps and Holders
117
Chapter Summary
177
Thinking in Reciprocal Space
191
14
215
Diffraction from Crystals
289
Chapter Preview
379
394
439
CHAPTER PREVIEW
500
ley Moodie and their coworkers principally at Melbourne and Arizona State University ASU in a series
507
Qualitative Xray Analysis
587
Microanalysis
599
CHAPTER PREVIEW
621
38
653

CHAPTER PREVIEW
319
Scattering and Diffraction
358

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