Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis, Volume 1Plenum Press, 1960 - X-rays |
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Page 41
... Factor Incident Power 2 Cos 20 = Polarization Factor Sin 20 Sin = = = - 2M e = P = A ( 0 ) = Va . V = = Lorenz Factor k Structure Factor = Σe Phase Lab Atomic Scattering Factor Temperature Factor ( can be taken as constant over small ...
... Factor Incident Power 2 Cos 20 = Polarization Factor Sin 20 Sin = = = - 2M e = P = A ( 0 ) = Va . V = = Lorenz Factor k Structure Factor = Σe Phase Lab Atomic Scattering Factor Temperature Factor ( can be taken as constant over small ...
Page 259
... factor is required to represent the range in concentration covered by the two line plots . " N " line plots require ( N - 1 ) factors , equal to the ratios of the slopes of each of the upper lines in a series of N lines , to the lower ...
... factor is required to represent the range in concentration covered by the two line plots . " N " line plots require ( N - 1 ) factors , equal to the ratios of the slopes of each of the upper lines in a series of N lines , to the lower ...
Page 264
... factors were constructed for Cb205 and for Ta205 showing the effect of iron and titanium on colum- bium and tantalum intensities . Table IV presents a general tabulation of these " correction - factor - curves " . A number of correction ...
... factors were constructed for Cb205 and for Ta205 showing the effect of iron and titanium on colum- bium and tantalum intensities . Table IV presents a general tabulation of these " correction - factor - curves " . A number of correction ...
Contents
PROJECT VANGUARD | 13 |
THE NEW HILGER MICROFOCUS XRAY GENERATOR | 17 |
A SIMPLIFIED PROCEDURE FOR CALCULATING | 37 |
Copyright | |
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absorption accuracy alloy alpha analyzing crystal anode atomic number background beta beta peak beta-excited bremsstrahlung calibration carbide carbon blacks chemical chromium collimator columbium composition concentration copper counting rate counts per second curve detector determined diameter dilution dilution equation effects electron beam elements emission energy equation error factor film fluorescence goniometer graphite instrument internal standard iron kyanite lattice layer lens lithium fluoride material matrix measured metal method microns microscope mixture molybdenum nickel Norelco obtained optical oxide oxygen particles peak percent phase photon plane powder proportional counter pulse quantitative quartz radiation range rare earth ratio reflection ruthenium sample holder satellite scintillation counter shown in Figure shows silicon slit solution specimen spectral spectrometer steel surface TABLE tantalum target techniques tion titanium tungsten uranium values voltage wavelength X-ray beam X-ray diffraction X-ray intensity X-Ray Microscope X-ray source X-ray spectrograph X-ray tube