X-Rays and Extreme Ultraviolet Radiation: Principles and Applications

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Cambridge University Press, Feb 16, 2017 - Technology & Engineering
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With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.

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Radiation and Scattering at EUV and XRay Wavelengths
Wave Propagation and Refractive Index at XRay and EUV Wavelengths
Coherence at Short Wavelengths
Synchrotron Radiation
Laser High Harmonic Generation
Physics of Hot Dense Plasmas
Extreme Ultraviolet and Soft XRay Lasers
Units and Physical Constants
Atomic Scattering Factors Atomic Absorption Coefficients
Mathematical and Vector Relationships
Some Integrations in k ωSpace
Frequency and Wavenumber Relations
The Lorentz Contraction of Length

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About the author (2017)

David Attwood is Professor Emeritus at the University of California, Berkeley. He is a co-founder of the Applied Science and Technology PhD program at Berkeley, and a Fellow of the American Physical Society and the Optical Society of America. He has published over 100 scientific papers and co-edited several books.

Anne Sakdinawat is a scientist at the SLAC National Accelerator Laboratory, where she leads a scientifically motivated imaging and nanofabrication group co-located at Stanford University. She is the recipient of the international Meyer-Ilse Award for advances in X-ray microscopy, and a US Department of Energy Early Career Award.

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