Glass, Volume 26 |
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Page 28
... overall enhanced image . Surface features less than 50 nm in height are
observable . Figure 9 shows the sharp images that are obtainable by using the
NDIC technique to reveal defects on the surface of a semiconductor crystal of Hg
. Cd1 ...
... overall enhanced image . Surface features less than 50 nm in height are
observable . Figure 9 shows the sharp images that are obtainable by using the
NDIC technique to reveal defects on the surface of a semiconductor crystal of Hg
. Cd1 ...
Page 32
It is seen from this figure that features on the line smaller than 1000 Å are easily
discernible ( Irene et al . , 1981 ) . Figure 11 shows a set of TEM micrographs of
crystalline Si islands that were observed to be present in thermal SiO2 films that ...
It is seen from this figure that features on the line smaller than 1000 Å are easily
discernible ( Irene et al . , 1981 ) . Figure 11 shows a set of TEM micrographs of
crystalline Si islands that were observed to be present in thermal SiO2 films that ...
Page 128
Figure 3 shows the compositions attempted superimposed on the behavior
diagram of Naik et al . ( 1978 ) . The figure axes are in units of equivalent
percentages . Readers unfamiliar with that method of representation are referred
to the paper ...
Figure 3 shows the compositions attempted superimposed on the behavior
diagram of Naik et al . ( 1978 ) . The figure axes are in units of equivalent
percentages . Readers unfamiliar with that method of representation are referred
to the paper ...
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Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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