Glass, Volume 26 |
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Page 35
For commercially available ellipsometers and for SiO2 on high - quality Si
substrates , numerical values for film thickness with an accuracy better than any
other instrument are possible when ellipsometry , typically better than 2 % , is
used .
For commercially available ellipsometers and for SiO2 on high - quality Si
substrates , numerical values for film thickness with an accuracy better than any
other instrument are possible when ellipsometry , typically better than 2 % , is
used .
Page 50
Although state - of - the - art SiO2 films can have a resistivity of better than 1016
12 cm , nonohmic high - field effects can drastically lower this number . The
dominant source of dc conduction in relatively pure silica glass is that associated
with ...
Although state - of - the - art SiO2 films can have a resistivity of better than 1016
12 cm , nonohmic high - field effects can drastically lower this number . The
dominant source of dc conduction in relatively pure silica glass is that associated
with ...
Page 132
diagrams . The amount of SizN4 that will dissolve in a given MgO - Al2O3SiO2 or
CaO - Al2O3 - SiO2 composition to produce the illustrated glassforming regions
is about 10 to 15 wt . % . However , much higher SizN4 solubilities ( up to 30 wt .
diagrams . The amount of SizN4 that will dissolve in a given MgO - Al2O3SiO2 or
CaO - Al2O3 - SiO2 composition to produce the illustrated glassforming regions
is about 10 to 15 wt . % . However , much higher SizN4 solubilities ( up to 30 wt .
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Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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Common terms and phrases
absorption addition analysis applications Basis bead behavior bulk calculated cause Ceram charge chemical coefficient components compositions conductivity constant containing cooling crystallization curve dependence described devices discussed Drexhage effects elastic electrical electron energy equation et al example fibers field Figure films fluoride glasses fluorozirconate function given heating heavy-metal fluoride glasses illustrated important increase indicated interface ions layers leaching less loss lower materials measured melt metal method nitrogen Nuclear Waste observed obtained occur optical oxide oxynitride glasses Phys physical Poulain predict prepared present produced properties range ratio reduced region relatively relaxation reported result sample scattering seal shown shows silica silicate glasses silicon similar SiO2 SizN4 Solids solution strain stress stress relaxation structural studies surface Table techniques temperature thermal thickness thin transition traps values viscosity Waste Management waste-glass wavelength York
Bibliographic information
| Title | Glass, Volume 26 Glass, Minoru Tomozawa Volume 12 of Treatise on materials science and technology |
| Editors | Minoru Tomozawa, R. H. Doremus |
| Publisher | Academic Press, 1977 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| ISBN | 0123418127, 9780123418128 |
| Export Citation | BiBTeX EndNote RefMan |