Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 10
... cause the generation of holes in the n region and electrons in the p region of the junction . These minority carriers cause leakage current to flow across the reverse - biased diodes . Such currents decrease sensitivity of the device to ...
... cause the generation of holes in the n region and electrons in the p region of the junction . These minority carriers cause leakage current to flow across the reverse - biased diodes . Such currents decrease sensitivity of the device to ...
Page 41
... cause characteristic changes in the C - V curves that can be analyzed to quantify them . The effects of interface traps and charges in high - frequency MOS C - V curves are shown schematically in Fig . 16a , b . The characteristic ...
... cause characteristic changes in the C - V curves that can be analyzed to quantify them . The effects of interface traps and charges in high - frequency MOS C - V curves are shown schematically in Fig . 16a , b . The characteristic ...
Page 105
... cause larger amounts of damage than would be obtained for lower doses over longer time periods . Although the understanding of radiation effects in glasses is not yet complete , all existing data indicate that the effect of radiation on ...
... cause larger amounts of damage than would be obtained for lower doses over longer time periods . Although the understanding of radiation effects in glasses is not yet complete , all existing data indicate that the effect of radiation on ...
Contents
vii | 57 |
RONALD E LOEHMAN 119 Sandia National Laboratories Albuquerque | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
Common terms and phrases
absorption coefficient AlF3 analysis Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses bulk modulus CCl4 Ceram chemical composite sphere constant cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-clad glass-forming region heavy-metal fluoride glasses increase interface traps ions layers leachability leaching Loehman Lucas materials measured melt metal Mitachi modulus MOSFET Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys Poulain properties Radioactive Waste radionuclides refractive index Rekhson result sample sandwich seal Scherer seal Eq setting temperature shown in Fig silicon SiO2 SiO2 films Solids solution split ring stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques thermal thickness viscoelastic viscosity vitreous vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4