Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 23
... depth of information in AES is limited by the Auger electron escape depth that is less than 50 Å . It is obvious that the surface is emphasized by this technique . In this connection , the quality of the vacuum and sample cleanliness ...
... depth of information in AES is limited by the Auger electron escape depth that is less than 50 Å . It is obvious that the surface is emphasized by this technique . In this connection , the quality of the vacuum and sample cleanliness ...
Page 24
... depth and energy loss based on classical scattering , nuclear back- scattering can measure composition variations as a function of depth without layer removal . The nuclear backscattering technique , because of the straightforward ...
... depth and energy loss based on classical scattering , nuclear back- scattering can measure composition variations as a function of depth without layer removal . The nuclear backscattering technique , because of the straightforward ...
Page 30
... depth of focus for an SEM can be 100 times larger than for the optical microscope . Transmission electron microscopy ... depths , of course , vary with atomic number and density of the material . In most applications , the film ...
... depth of focus for an SEM can be 100 times larger than for the optical microscope . Transmission electron microscopy ... depths , of course , vary with atomic number and density of the material . In most applications , the film ...
Contents
vii | 57 |
RONALD E LOEHMAN 119 Sandia National Laboratories Albuquerque | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
Common terms and phrases
absorption coefficient AlF3 analysis Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses bulk modulus CCl4 Ceram chemical composite sphere constant cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-clad glass-forming region heavy-metal fluoride glasses increase interface traps ions layers leachability leaching Loehman Lucas materials measured melt metal Mitachi modulus MOSFET Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys Poulain properties Radioactive Waste radionuclides refractive index Rekhson result sample sandwich seal Scherer seal Eq setting temperature shown in Fig silicon SiO2 SiO2 films Solids solution split ring stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques thermal thickness viscoelastic viscosity vitreous vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4