Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 39
... distribution in the metal and the p - type silicon is shown for three different regions of gate voltage in ( a ) . are shown schematically in Fig . 15a , b . The capacitance of an MOS capacitor on a p - type substrate is shown as a ...
... distribution in the metal and the p - type silicon is shown for three different regions of gate voltage in ( a ) . are shown schematically in Fig . 15a , b . The capacitance of an MOS capacitor on a p - type substrate is shown as a ...
Page 42
... distribution of electric field in an oxide of thickness tox . The field in the absence of the charge is shown by the dotted line in this figure and is due solely to the externally applied voltage . The field in the absence of any ...
... distribution of electric field in an oxide of thickness tox . The field in the absence of the charge is shown by the dotted line in this figure and is due solely to the externally applied voltage . The field in the absence of any ...
Page 97
... distribution of sizes of glass chunks and small particles produced from thermal and residual stresses arising from various cooling rates were determined for simulated commercial waste - glass forms at Battelle Pacific Northwest ...
... distribution of sizes of glass chunks and small particles produced from thermal and residual stresses arising from various cooling rates were determined for simulated commercial waste - glass forms at Battelle Pacific Northwest ...
Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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absorption coefficient AlF3 analysis BaF2 Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses CCl4 Ceram chemical cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate glasses fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-forming region heavy-metal fluoride glasses HfF4 impurities increase interface traps ions layers leaching Loehman Lucas Manabe Matecki materials measured melt metal Mitachi Miyashita Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys prepared properties Radioactive Waste radionuclides refractive index Rekhson relaxation function sample sandwich seal scattering setting temperature shown in Fig silicon SiO2 Solids solution stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques ternary thermal ThF4 thickness viscoelastic viscosity vitreous fluorides vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4