Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 2
... electrical properties in thin dielectric films require a perspective different from that used in studying bulk glasses . In particular since the semiconductor devices in which thin glass film is used determine which properties are ...
... electrical properties in thin dielectric films require a perspective different from that used in studying bulk glasses . In particular since the semiconductor devices in which thin glass film is used determine which properties are ...
Page 41
... electrical quality of the interface that controls device operation . Physical measurements such as electron spin resonance ( ESR ) have been carried out on thin oxide films ( Caplan and Poindexter , 1979 ; Marquart and Sigel , 1975 ...
... electrical quality of the interface that controls device operation . Physical measurements such as electron spin resonance ( ESR ) have been carried out on thin oxide films ( Caplan and Poindexter , 1979 ; Marquart and Sigel , 1975 ...
Page 140
... electrical properties of oxynitride glasses . Elmer and Nordberg ( 1967 ) reported an increase in resistivity by about a factor of 40 at 350 ° C in a glass to which 3 - wt . % nitrogen had been added . The specimen was prepared by ...
... electrical properties of oxynitride glasses . Elmer and Nordberg ( 1967 ) reported an increase in resistivity by about a factor of 40 at 350 ° C in a glass to which 3 - wt . % nitrogen had been added . The specimen was prepared by ...
Contents
vii | 57 |
RONALD E LOEHMAN 119 Sandia National Laboratories Albuquerque | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
Common terms and phrases
absorption coefficient AlF3 analysis Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses bulk modulus CCl4 Ceram chemical composite sphere constant cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-clad glass-forming region heavy-metal fluoride glasses increase interface traps ions layers leachability leaching Loehman Lucas materials measured melt metal Mitachi modulus MOSFET Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys Poulain properties Radioactive Waste radionuclides refractive index Rekhson result sample sandwich seal Scherer seal Eq setting temperature shown in Fig silicon SiO2 SiO2 films Solids solution split ring stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques thermal thickness viscoelastic viscosity vitreous vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4