Glass, Volume 26 |
From inside the book
Results 1-3 of 50
Page 2
technology . Readers interested in packaging are referred to the comprehensive
review by Schnable et al . ( 1975 ) . Studies of the physical and electrical
properties in thin dielectric films require a perspective different from that used in
studying ...
technology . Readers interested in packaging are referred to the comprehensive
review by Schnable et al . ( 1975 ) . Studies of the physical and electrical
properties in thin dielectric films require a perspective different from that used in
studying ...
Page 41
More important , such measurements directly characterize the electrical quality of
the interface that controls device operation . Physical measurements such as
electron spin resonance ( ESR ) have been carried out on thin oxide films (
Caplan ...
More important , such measurements directly characterize the electrical quality of
the interface that controls device operation . Physical measurements such as
electron spin resonance ( ESR ) have been carried out on thin oxide films (
Caplan ...
Page 140
Leedecke and Loehman ( 1980 ) studied the electrical behavior of some of the Y
- Si - Al - O - N glass compositions listed in Table I . Table V presents the
parameters that were calculated from their data . It can be seen that all of the
glasses ...
Leedecke and Loehman ( 1980 ) studied the electrical behavior of some of the Y
- Si - Al - O - N glass compositions listed in Table I . Table V presents the
parameters that were calculated from their data . It can be seen that all of the
glasses ...
What people are saying - Write a review
We haven't found any reviews in the usual places.
Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
Other editions - View all
Common terms and phrases
absorption addition analysis applications Basis bead behavior bulk calculated cause Ceram charge chemical coefficient components compositions conductivity constant containing cooling crystallization curve dependence described devices discussed Drexhage effects elastic electrical electron energy equation et al example fibers field Figure films fluoride glasses fluorozirconate function given heating heavy-metal fluoride glasses illustrated important increase indicated interface ions layers leaching less loss lower materials measured melt metal method nitrogen Nuclear Waste observed obtained occur optical oxide oxynitride glasses Phys physical Poulain predict prepared present produced properties range ratio reduced region relatively relaxation reported result sample scattering seal shown shows silica silicate glasses silicon similar SiO2 SizN4 Solids solution strain stress stress relaxation structural studies surface Table techniques temperature thermal thickness thin transition traps values viscosity Waste Management waste-glass wavelength York