Glass, Volume 26 |
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Page 3
As illustrated in Fig . 2c , this technology permits the simultaneous fabrication of
large numbers of p - njunctions on the same piece of silicon with precise control
over the spatial extent and doping profile of the junction . The patterning and ...
As illustrated in Fig . 2c , this technology permits the simultaneous fabrication of
large numbers of p - njunctions on the same piece of silicon with precise control
over the spatial extent and doping profile of the junction . The patterning and ...
Page 6
In an integrated circuit the elements of the circuit are fabricated in close proximity
on the same piece of silicon by using a process similar to the planar technology
illustrated in Fig . 2c . These steps produce many devices such as those shown ...
In an integrated circuit the elements of the circuit are fabricated in close proximity
on the same piece of silicon by using a process similar to the planar technology
illustrated in Fig . 2c . These steps produce many devices such as those shown ...
Page 41
The characteristic effects of interface traps and fixed charge on the high -
frequency C - V measurement are illustrated in Fig . 16 . Interface traps cause a
distortion of the curve from its ideal shape , as illustrated in Fig . 16a . The
distortion ...
The characteristic effects of interface traps and fixed charge on the high -
frequency C - V measurement are illustrated in Fig . 16 . Interface traps cause a
distortion of the curve from its ideal shape , as illustrated in Fig . 16a . The
distortion ...
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Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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absorption addition analysis applications Basis bead behavior bulk calculated cause Ceram charge chemical coefficient components compositions conductivity constant containing cooling crystallization curve dependence described devices discussed Drexhage effects elastic electrical electron energy equation et al example fibers field Figure films fluoride glasses fluorozirconate function given heating heavy-metal fluoride glasses illustrated important increase indicated interface ions layers leaching less loss lower materials measured melt metal method nitrogen Nuclear Waste observed obtained occur optical oxide oxynitride glasses Phys physical Poulain predict prepared present produced properties range ratio reduced region relatively relaxation reported result sample scattering seal shown shows silica silicate glasses silicon similar SiO2 SizN4 Solids solution strain stress stress relaxation structural studies surface Table techniques temperature thermal thickness thin transition traps values viscosity Waste Management waste-glass wavelength York
Bibliographic information
| Title | Glass, Volume 26 Glass, Minoru Tomozawa Volume 12 of Treatise on materials science and technology |
| Editors | Minoru Tomozawa, R. H. Doremus |
| Publisher | Academic Press, 1977 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| ISBN | 0123418127, 9780123418128 |
| Export Citation | BiBTeX EndNote RefMan |