Glass, Volume 26 |
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Page 26
Figure 8 shows the relevant ESCA spectrum of the Si - rich SiO2 . Figure 8a is for
an unannealed Si - rich SiO2 film and shows broad peaks that are decomposed
into Gaussian peaks at 97 , 99 , and 102 eV . Figure 8b shows that after ...
Figure 8 shows the relevant ESCA spectrum of the Si - rich SiO2 . Figure 8a is for
an unannealed Si - rich SiO2 film and shows broad peaks that are decomposed
into Gaussian peaks at 97 , 99 , and 102 eV . Figure 8b shows that after ...
Page 32
Figure 11 shows a set of TEM micrographs of crystalline Si islands that were
observed to be present in thermal SiO2 films that were prepared at oxidation
temperatures above 1100°C ( Irene , 1978a ) . Figure 11a shows a bright - field
picture ...
Figure 11 shows a set of TEM micrographs of crystalline Si islands that were
observed to be present in thermal SiO2 films that were prepared at oxidation
temperatures above 1100°C ( Irene , 1978a ) . Figure 11a shows a bright - field
picture ...
Page 271
Figure 9 shows the excellent agreement between measured and calculated
stresses developed during cooling and reheating of a sandwich seal ( Scherer
and Rekhson , 1982c ) . The physical properties of the glass were calculated by
using ...
Figure 9 shows the excellent agreement between measured and calculated
stresses developed during cooling and reheating of a sandwich seal ( Scherer
and Rekhson , 1982c ) . The physical properties of the glass were calculated by
using ...
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Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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Common terms and phrases
absorption addition analysis applications Basis bead behavior bulk calculated cause Ceram charge chemical coefficient components compositions conductivity constant containing cooling crystallization curve dependence described devices discussed Drexhage effects elastic electrical electron energy equation et al example fibers field Figure films fluoride glasses fluorozirconate function given heating heavy-metal fluoride glasses illustrated important increase indicated interface ions layers leaching less loss lower materials measured melt metal method nitrogen Nuclear Waste observed obtained occur optical oxide oxynitride glasses Phys physical Poulain predict prepared present produced properties range ratio reduced region relatively relaxation reported result sample scattering seal shown shows silica silicate glasses silicon similar SiO2 SizN4 Solids solution strain stress stress relaxation structural studies surface Table techniques temperature thermal thickness thin transition traps values viscosity Waste Management waste-glass wavelength York
Bibliographic information
| Title | Glass, Volume 26 Glass, Minoru Tomozawa Volume 12 of Treatise on materials science and technology |
| Editors | Minoru Tomozawa, R. H. Doremus |
| Publisher | Academic Press, 1977 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| ISBN | 0123418127, 9780123418128 |
| Export Citation | BiBTeX EndNote RefMan |