Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 3
... silicon are labeled by type as n or p . Current flows between emitter ( source ) and collector ( drain ) and is controlled by voltages applied to the base ( gate ) in the bipolar ( FET ) devices . The SiO2 films are indicated by the ...
... silicon are labeled by type as n or p . Current flows between emitter ( source ) and collector ( drain ) and is controlled by voltages applied to the base ( gate ) in the bipolar ( FET ) devices . The SiO2 films are indicated by the ...
Page 9
... silicon is contacted by a stripe of deposited polycrystalline silicon ( polysilicon ) . An older and less- advanced technology uses an aluminum contact directly over the gate oxide . The polysilicon gate technology in this example is ...
... silicon is contacted by a stripe of deposited polycrystalline silicon ( polysilicon ) . An older and less- advanced technology uses an aluminum contact directly over the gate oxide . The polysilicon gate technology in this example is ...
Page 43
... silicon and the change in field becomes larger . This lever - arm effect is similar to that encountered in ... silicon interface and lowered at the aluminum interface . With the gate as the origin of the coordinate system , the magnitude ...
... silicon and the change in field becomes larger . This lever - arm effect is similar to that encountered in ... silicon interface and lowered at the aluminum interface . With the gate as the origin of the coordinate system , the magnitude ...
Contents
vii | 57 |
RONALD E LOEHMAN 119 Sandia National Laboratories Albuquerque | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
Common terms and phrases
absorption coefficient AlF3 analysis Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses bulk modulus CCl4 Ceram chemical composite sphere constant cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-clad glass-forming region heavy-metal fluoride glasses increase interface traps ions layers leachability leaching Loehman Lucas materials measured melt metal Mitachi modulus MOSFET Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys Poulain properties Radioactive Waste radionuclides refractive index Rekhson result sample sandwich seal Scherer seal Eq setting temperature shown in Fig silicon SiO2 SiO2 films Solids solution split ring stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques thermal thickness viscoelastic viscosity vitreous vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4