Glass, Volume 26 |
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Page 9
Thick and thin oxide layers are grown or deposited on the substrate and act as
diffusion masks at various stages to allow the formation of heavily doped n - type
regions ( n * ) . The thin gate oxide over the p - type silicon is contacted by a
stripe ...
Thick and thin oxide layers are grown or deposited on the substrate and act as
diffusion masks at various stages to allow the formation of heavily doped n - type
regions ( n * ) . The thin gate oxide over the p - type silicon is contacted by a
stripe ...
Page 49
Although the ionic transport is due to the same physical mechanisms in both bulk
and thin - film SiO2 , the thin - film effects are important at much lower
concentrations . In bulk glasses , losses are measured at sodium concentrations
of 1 ...
Although the ionic transport is due to the same physical mechanisms in both bulk
and thin - film SiO2 , the thin - film effects are important at much lower
concentrations . In bulk glasses , losses are measured at sodium concentrations
of 1 ...
Page 333
Techniques in the Study of Corrosion and Passivity C . Gabrielli , M . Keddam ,
and H . Takenouti INDEX VOLUME 24 : PREPARATION AND PROPERTIES OF
THIN FILMS Preparation and Property Correlations in Thin Films K . N . Tu and R
...
Techniques in the Study of Corrosion and Passivity C . Gabrielli , M . Keddam ,
and H . Takenouti INDEX VOLUME 24 : PREPARATION AND PROPERTIES OF
THIN FILMS Preparation and Property Correlations in Thin Films K . N . Tu and R
...
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Contents
Nuclear Waste Glasses | 57 |
Oxynitride Glasses | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
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Common terms and phrases
absorption addition analysis applications Basis bead behavior bulk calculated cause Ceram charge chemical coefficient components compositions conductivity constant containing cooling crystallization curve dependence described devices discussed Drexhage effects elastic electrical electron energy equation et al example fibers field Figure films fluoride glasses fluorozirconate function given heating heavy-metal fluoride glasses illustrated important increase indicated interface ions layers leaching less loss lower materials measured melt metal method nitrogen Nuclear Waste observed obtained occur optical oxide oxynitride glasses Phys physical Poulain predict prepared present produced properties range ratio reduced region relatively relaxation reported result sample scattering seal shown shows silica silicate glasses silicon similar SiO2 SizN4 Solids solution strain stress stress relaxation structural studies surface Table techniques temperature thermal thickness thin transition traps values viscosity Waste Management waste-glass wavelength York
Bibliographic information
| Title | Glass, Volume 26 Glass, Minoru Tomozawa Volume 12 of Treatise on materials science and technology |
| Editors | Minoru Tomozawa, R. H. Doremus |
| Publisher | Academic Press, 1977 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| ISBN | 0123418127, 9780123418128 |
| Export Citation | BiBTeX EndNote RefMan |