Glass, Volume 26Minoru Tomozawa, R. H. Doremus Academic Press, 1977 - Glass |
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Page 43
... trapped under the aluminum gate has little or no effect on the field at the Si interface . However , Na + ions are ... trapped at the interface under these circumstances ( DiMaria et al . , 1977 ) . The observed shifts in this case are ...
... trapped under the aluminum gate has little or no effect on the field at the Si interface . However , Na + ions are ... trapped at the interface under these circumstances ( DiMaria et al . , 1977 ) . The observed shifts in this case are ...
Page 47
... trapped charge . These charges result from traps in the oxide being filled by carriers that are introduced into the oxide by some current flow through the oxide after the device is fabricated . As mentioned earlier , such currents flow ...
... trapped charge . These charges result from traps in the oxide being filled by carriers that are introduced into the oxide by some current flow through the oxide after the device is fabricated . As mentioned earlier , such currents flow ...
Page 51
... trap- assisted tunneling . In relatively trap - free SiO2 films , this process is less important . Dielectric breakdown is an important consideration in the design and reliability of semiconductor devices and is a major factor in ...
... trap- assisted tunneling . In relatively trap - free SiO2 films , this process is less important . Dielectric breakdown is an important consideration in the design and reliability of semiconductor devices and is a major factor in ...
Contents
vii | 57 |
RONALD E LOEHMAN 119 Sandia National Laboratories Albuquerque | 119 |
HeavyMetal Fluoride Glasses | 151 |
Copyright | |
3 other sections not shown
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absorption coefficient AlF3 analysis Basis for Nuclear bead seal behavior Bendow borosilicate glass bulk glasses bulk modulus CCl4 Ceram chemical composite sphere constant cooling corrosion crystalline crystallization curve dB/km devices dielectric Drexhage effects elastic electrical electron energy fibers fluorohafnate fluorozirconate glasses fused silica glass formation glass transition glass transition temperature glass-clad glass-forming region heavy-metal fluoride glasses increase interface traps ions layers leachability leaching Loehman Lucas materials measured melt metal Mitachi modulus MOSFET Moynihan nitride nitrogen Non-Cryst Nuclear Waste Nuclear Waste Management observed optical optical fibers oxide glasses oxynitride glasses Phys Poulain properties Radioactive Waste radionuclides refractive index Rekhson result sample sandwich seal Scherer seal Eq setting temperature shown in Fig silicon SiO2 SiO2 films Solids solution split ring stiffness ratio stress relaxation structural relaxation studies Subsection substrate surface Table techniques thermal thickness viscoelastic viscosity vitreous vitrification Waste Management waste-glass forms wavelength ZBLA ZBLAN ZrF4