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Microstructural Characterization of Thin Films
Fundamental Concepts of Diffraction
Epitaxial Monocrystalline Films
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activity addition alloys approximation average beam becomes calculated compaction component composition compositional dependences compression concentration configurational considered constant copper correlation corresponding critical crystal CsCl phases cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations experimental expression factor fault field Figure function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane position possible powder present pressure probability production properties random ratio region relative respectively shown in Fig shows single crystals sintering solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations yield