Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
From inside the book
Results 1-3 of 83
Page 57
... shows a white beam synchrotron X - ray topograph ( g = 441 , λ = 0.5Å ) recorded from the same crystal . The image is a composite made from several separate images , each recorded with the relatively small area white beam , available at ...
... shows a white beam synchrotron X - ray topograph ( g = 441 , λ = 0.5Å ) recorded from the same crystal . The image is a composite made from several separate images , each recorded with the relatively small area white beam , available at ...
Page 215
... show the position of the atoms and the ( 111 ) planes after introduction of the defect ( 0 or N ) . The distorted lattice shows clear similarities to a rumpled w - phase [ 6 ] . In order to learn more about this close connection between ...
... show the position of the atoms and the ( 111 ) planes after introduction of the defect ( 0 or N ) . The distorted lattice shows clear similarities to a rumpled w - phase [ 6 ] . In order to learn more about this close connection between ...
Page 327
... shows that the minimum amount of boron appears on this wafer and figure 3 presents the boron spectrum . Figure 4 shows the presence of two boron peaks on a wafer with polysilicon deposited over thermal oxide at 620 ° C. The first peak ...
... shows that the minimum amount of boron appears on this wafer and figure 3 presents the boron spectrum . Figure 4 shows the presence of two boron peaks on a wafer with polysilicon deposited over thermal oxide at 620 ° C. The first peak ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
Copyright | |
64 other sections not shown
Other editions - View all
Common terms and phrases
1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO