## Elements of X-Ray Diffraction |

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Page 372

In ordered

the atom arrangement is such that there is no longer three-fold rotational

symmetry about directions of the form (111). Inasmuch as this is the minimum

symmetry ...

In ordered

**AuCu**, on the other hand, to consider only the tetragonal modification,the atom arrangement is such that there is no longer three-fold rotational

symmetry about directions of the form (111). Inasmuch as this is the minimum

symmetry ...

Page 377

(a) What is the Bravais lattice of

Calculate the structure factors for the disordered and ordered (tetragonal) forms

of

(a) What is the Bravais lattice of

**AuCu**(I), the ordered tetragonal modification? (6)Calculate the structure factors for the disordered and ordered (tetragonal) forms

of

**AuCu**. (c) On the basis of the calculations made in (6) and a consideration of ...Page 512

... 486, 487 Nondispersive analysis, 419 Nonprimitive cells, 33, 36 North America

Philips Co., 179, 417 Optimum specimen thickness, 164 Order, long-range, 363

parameter, 366 short-range, 375 Order-disorder transformations, 363 in

... 486, 487 Nondispersive analysis, 419 Nonprimitive cells, 33, 36 North America

Philips Co., 179, 417 Optimum specimen thickness, 164 Order, long-range, 363

parameter, 366 short-range, 375 Order-disorder transformations, 363 in

**AuCu**, ...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone