Elements of X-ray Diffraction |
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Page 84
... Bragg law . Since sine cannot exceed unity , we may write ηλ = sin 0 < 1 . 2d ' ( 3-2 ) X Therefore , nλ must be less than 2d ' . For diffraction , the smallest value of n is 1. ( n = 0 corresponds to the beam diffracted in the same ...
... Bragg law . Since sine cannot exceed unity , we may write ηλ = sin 0 < 1 . 2d ' ( 3-2 ) X Therefore , nλ must be less than 2d ' . For diffraction , the smallest value of n is 1. ( n = 0 corresponds to the beam diffracted in the same ...
Page 89
... equation of the type of Eqs . ( 3-10 ) and ( 3-11 ) . It is in this sense that equations of this kind predict all possible diffracted beams .し 3-6 Diffraction methods . Diffraction can occur whenever the Bragg law , λ = 2d sin e , is ...
... equation of the type of Eqs . ( 3-10 ) and ( 3-11 ) . It is in this sense that equations of this kind predict all possible diffracted beams .し 3-6 Diffraction methods . Diffraction can occur whenever the Bragg law , λ = 2d sin e , is ...
Page 112
... Bragg law , which is , in a sense , a negative law . If the Bragg law is not satisfied , no diffracted beam can occur ; however , the Bragg law may be satisfied for a certain set of atomic planes and yet no diffraction may occur , as in ...
... Bragg law , which is , in a sense , a negative law . If the Bragg law is not satisfied , no diffracted beam can occur ; however , the Bragg law may be satisfied for a certain set of atomic planes and yet no diffraction may occur , as in ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone