Elements of X-ray Diffraction |
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Page 137
... Debye pattern of silver made with Cu Ka radiation . Ignore the temperature and absorption factors . 4-8 . A Debye - Scherrer pattern of tungsten ( BCC ) is made with Cu Ka radia- tion . The first four lines on this pattern were observed ...
... Debye pattern of silver made with Cu Ka radiation . Ignore the temperature and absorption factors . 4-8 . A Debye - Scherrer pattern of tungsten ( BCC ) is made with Cu Ka radia- tion . The first four lines on this pattern were observed ...
Page 149
... Debye and Scherrer in Germany and in 1917 by Hull in the United States . It is the most generally useful of all diffraction methods and , when properly employed , can yield a great deal of structural information ... Debye-Scherrer method.
... Debye and Scherrer in Germany and in 1917 by Hull in the United States . It is the most generally useful of all diffraction methods and , when properly employed , can yield a great deal of structural information ... Debye-Scherrer method.
Page 510
... Debye - Scherrer camera , 149 high - temperature , 156 Debye - Scherrer method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect ...
... Debye - Scherrer camera , 149 high - temperature , 156 Debye - Scherrer method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone