Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 138
CHAPTER 5 LAUE PHOTOGRAPHS 5–1 Introduction. The experimental
methods used in obtaining diffraction patterns will be described in this chapter
and the two following ones. Here we are concerned with the Laue method only
from the ...
CHAPTER 5 LAUE PHOTOGRAPHS 5–1 Introduction. The experimental
methods used in obtaining diffraction patterns will be described in this chapter
and the two following ones. Here we are concerned with the Laue method only
from the ...
Page 215
In this chapter the three main x-ray methods of determining crystal orientation will
be described: the back-reflection Laue method, the transmission Laue method,
and the diffractometer method. It is also convenient to treat here the question of ...
In this chapter the three main x-ray methods of determining crystal orientation will
be described: the back-reflection Laue method, the transmission Laue method,
and the diffractometer method. It is also convenient to treat here the question of ...
Page 512
... 326 with diffractometer, 334 with pinhole camera, 333 LAUE, M. von, 78, 367,
457 Laue cameras, back-reflection, 140 specimen holders, 143 transmission,
138 Laue equations, 497 Laue method, 89, 502 back-reflection, 90, 215
diffraction ...
... 326 with diffractometer, 334 with pinhole camera, 333 LAUE, M. von, 78, 367,
457 Laue cameras, back-reflection, 140 specimen holders, 143 transmission,
138 Laue equations, 497 Laue method, 89, 502 back-reflection, 90, 215
diffraction ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |