Elements of X-ray Diffraction |
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Page 89
... methods : λ Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment . A ...
... methods : λ Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment . A ...
Page 215
... methods of determining crystal orientation will be described : the back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal ...
... methods of determining crystal orientation will be described : the back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal ...
Page 512
... LAUE , M. VON , 78 , 367 , 457 Laue cameras , back - reflection , 140 specimen holders , 143 transmission , 138 Laue equations , 497 Laue method , 89 , 502 back - reflection , 90 , 215 diffraction spot shape , 146 experimental technique ...
... LAUE , M. VON , 78 , 367 , 457 Laue cameras , back - reflection , 140 specimen holders , 143 transmission , 138 Laue equations , 497 Laue method , 89 , 502 back - reflection , 90 , 215 diffraction spot shape , 146 experimental technique ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone