Elements of X-ray Diffraction |
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Page 140
... Laue spot is found very simply from the relation T1 tan 20 = D ( 5-1 ) where ... spots , other variables , such as tube current and exposure time , being ... Laue spots near the center of a transmission pattern are caused by first - order ...
... Laue spot is found very simply from the relation T1 tan 20 = D ( 5-1 ) where ... spots , other variables , such as tube current and exposure time , being ... Laue spots near the center of a transmission pattern are caused by first - order ...
Page 147
... Laue method . S = source , C focal point . = crystal , F = from a small source , real or virtual . Each ray of the incident beam which lies in the plane of the drawing strikes the ... Laue pattern 5-5 ] 147 THE SHAPES OF LAUE SPOTS.
... Laue method . S = source , C focal point . = crystal , F = from a small source , real or virtual . Each ray of the incident beam which lies in the plane of the drawing strikes the ... Laue pattern 5-5 ] 147 THE SHAPES OF LAUE SPOTS.
Page 248
... Laue spot enlarged Laue spot Debye arc potential Debye ring ( a ) Undeformed ... spots . These are portions of Debye rings , such as one might expect on a ... Laue spot then becomes enlarged as a result of lattice deformation and spreads ...
... Laue spot enlarged Laue spot Debye arc potential Debye ring ( a ) Undeformed ... spots . These are portions of Debye rings , such as one might expect on a ... Laue spot then becomes enlarged as a result of lattice deformation and spreads ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone