Elements of X-ray Diffraction |
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Page 13
... absorption edge must be shorter than that of any K characteristic line . As the wavelength of the incident beam is decreased below λK , the ab- sorption coefficient begins to decrease again , even though the production of K fluorescent ...
... absorption edge must be shorter than that of any K characteristic line . As the wavelength of the incident beam is decreased below λK , the ab- sorption coefficient begins to decrease again , even though the production of K fluorescent ...
Page 424
... absorption of the sample with wavelength . In the wave- length range from 0.5 to 1.5A , for example , the average difference between the Ka wavelengths of an element of atomic number Z and one of ... ABSORPTION 16-2 Absorption-edge method.
... absorption of the sample with wavelength . In the wave- length range from 0.5 to 1.5A , for example , the average difference between the Ka wavelengths of an element of atomic number Z and one of ... ABSORPTION 16-2 Absorption-edge method.
Page 425
... edge is due to the fact that the intensity of the incident beam increases with wavelength in this region of the continuous spectrum and this effect more than compensates for the increase in the absorption ... ABSORPTION - EDGE METHOD.
... edge is due to the fact that the intensity of the incident beam increases with wavelength in this region of the continuous spectrum and this effect more than compensates for the increase in the absorption ... ABSORPTION - EDGE METHOD.
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone