Elements of X-ray Diffraction |
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Page xii
... ANALYSIS BY DIFFRACTION 378 14-1 Introduction 378 QUALITATIVE ANALYSIS 14-2 Basic principles 14-3 Hanawalt method 14-4 Examples of qualitative analysis 14-5 Practical difficulties 14-6 Identification of surface deposits 379 379 383 386 ...
... ANALYSIS BY DIFFRACTION 378 14-1 Introduction 378 QUALITATIVE ANALYSIS 14-2 Basic principles 14-3 Hanawalt method 14-4 Examples of qualitative analysis 14-5 Practical difficulties 14-6 Identification of surface deposits 379 379 383 386 ...
Page 378
... analysis . Qualitative analysis for a par- ticular substance is accomplished by identification of the pattern of that substance . Quantitative analysis is also possible , because the intensities of the diffraction lines due to one ...
... analysis . Qualitative analysis for a par- ticular substance is accomplished by identification of the pattern of that substance . Quantitative analysis is also possible , because the intensities of the diffraction lines due to one ...
Page 402
... analysis . If the various elements in the sample to be analyzed are made to emit their characteristic lines by electron or x - ray bombardment , then these elements may be identified by analyzing the emitted radiation and showing that ...
... analysis . If the various elements in the sample to be analyzed are made to emit their characteristic lines by electron or x - ray bombardment , then these elements may be identified by analyzing the emitted radiation and showing that ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone