Elements of X-ray Diffraction |
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Page 98
... angle 20 , is therefore zero . It is also zero at an angle 202 where 02 is such that ray N ' from the mth plane below the surface is ( m − 1 ) wavelengths out of phase with ray C ' from the surface plane . It follows that the ...
... angle 20 , is therefore zero . It is also zero at an angle 202 where 02 is such that ray N ' from the mth plane below the surface is ( m − 1 ) wavelengths out of phase with ray C ' from the surface plane . It follows that the ...
Page 125
... angle . characteristic of the specimen while the latter is influenced by slight adjust- ments of the experimental ... angle B with the incident beam , the Bragg law is exactly satisfied and the intensity diffracted in the direction 20 is ...
... angle . characteristic of the specimen while the latter is influenced by slight adjust- ments of the experimental ... angle B with the incident beam , the Bragg law is exactly satisfied and the intensity diffracted in the direction 20 is ...
Page 225
... angle is . Then the projection is rotated by the same angle with respect to the underlying Wulff net and the zone axis is plotted on the vertical axis of the pro- jection at an angle y from the circumference , as in ( b ) . ( Note that ...
... angle is . Then the projection is rotated by the same angle with respect to the underlying Wulff net and the zone axis is plotted on the vertical axis of the pro- jection at an angle y from the circumference , as in ( b ) . ( Note that ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone