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Results 1-3 of 54
Page 19
1–14, the voltage applied to the tube is controlled by the autotransformer which
controls the voltage applied to the primary of the high-voltage transformer. The
voltmeter shown measures the input voltage but may be calibrated, if desired, ...
1–14, the voltage applied to the tube is controlled by the autotransformer which
controls the voltage applied to the primary of the high-voltage transformer. The
voltmeter shown measures the input voltage but may be calibrated, if desired, ...
Page 431
... magnitude of the applied stress, this new spacing being essentially constant
from one grain to another for any particular set of planes. This uniform
macrostrain, as we saw in Sec. 9–4, causes a shift of the diffraction lines to new
20 positions.
... magnitude of the applied stress, this new spacing being essentially constant
from one grain to another for any particular set of planes. This uniform
macrostrain, as we saw in Sec. 9–4, causes a shift of the diffraction lines to new
20 positions.
Page 486
The wavelength associated with the electrons depends on the applied voltage,
since the kinetic energy of the electrons is given by #my” = et), (2) where e is the
charge on the electron and U the applied voltage (in esu). Combination of Eqs. (1
) ...
The wavelength associated with the electrons depends on the applied voltage,
since the kinetic energy of the electrons is given by #my” = et), (2) where e is the
charge on the electron and U the applied voltage (in esu). Combination of Eqs. (1
) ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |