Elements of X-ray Diffraction |
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Page 141
... Back - reflection Laue camera . The specimen holder shown permits vertical adjustment of the specimen , as well as ... Back - reflection Laue camera ( schematic ) . where r2 = distance of spot from center of film and D = specimen - to ...
... Back - reflection Laue camera . The specimen holder shown permits vertical adjustment of the specimen , as well as ... Back - reflection Laue camera ( schematic ) . where r2 = distance of spot from center of film and D = specimen - to ...
Page 215
... back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal deformation and the measure- ment of this ... Back-reflection Laue method.
... back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal deformation and the measure- ment of this ... Back-reflection Laue method.
Page 269
... Back - reflection pinhole patterns of coarse - grained recrystal- Unfiltered copper ra- lized copper . diation : ( a ) from surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ...
... Back - reflection pinhole patterns of coarse - grained recrystal- Unfiltered copper ra- lized copper . diation : ( a ) from surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone