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Page 156
6-5 Cameras for high and low temperatures. ... by quenching the specimen at a
high enough rate to suppress the decomposition of the high-temperature phase
and then examining the specimen in an ordinary camera at room temperature.
6-5 Cameras for high and low temperatures. ... by quenching the specimen at a
high enough rate to suppress the decomposition of the high-temperature phase
and then examining the specimen in an ordinary camera at room temperature.
Page 160
A powder specimen may also be used in this camera by fixing a thin layer of the
powder to a piece of paper with glue or petroleum jelly. The paper is then curved
and held against the camera circumference by an attachment provided with the ...
A powder specimen may also be used in this camera by fixing a thin layer of the
powder to a piece of paper with glue or petroleum jelly. The paper is then curved
and held against the camera circumference by an attachment provided with the ...
Page 333
11-3 Back-reflection focusing cameras. A camera of this kind is preferred for work
of the highest precision, since the position of a diffraction line on the film is twice
as sensitive to small changes in plane spacing with this camera as it is with a ...
11-3 Back-reflection focusing cameras. A camera of this kind is preferred for work
of the highest precision, since the position of a diffraction line on the film is twice
as sensitive to small changes in plane spacing with this camera as it is with a ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |