Elements of X-ray Diffraction |
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Page 166
... causes . The two effects together may cause the weakest diffraction line to be almost invisible in relation to the background . This background intensity is due to the following causes : ( 1 ) Fluorescent radiation emitted by the ...
... causes . The two effects together may cause the weakest diffraction line to be almost invisible in relation to the background . This background intensity is due to the following causes : ( 1 ) Fluorescent radiation emitted by the ...
Page 265
... cause of broadening , with grain fragmentation possibly a minor contributing cause . Actually , it is impossible to generalize , inasmuch as different metals and alloys may behave quite differently . By advanced methods of mathematical ...
... cause of broadening , with grain fragmentation possibly a minor contributing cause . Actually , it is impossible to generalize , inasmuch as different metals and alloys may behave quite differently . By advanced methods of mathematical ...
Page 398
... cause a variation in maximum intensity independent of sample composition . 14-11 Practical difficulties . There are certain effects which can cause great difficulty in quantitative analysis because they cause observed in- tensities to ...
... cause a variation in maximum intensity independent of sample composition . 14-11 Practical difficulties . There are certain effects which can cause great difficulty in quantitative analysis because they cause observed in- tensities to ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone