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Page 166
It cannot be employed with ferrous materials, however, since it will cause
fluorescent radiation from the iron in the specimen; instead, Co Ko, Fe Ko or Cr
Ko, radiation should be used. Precise lattice-parameter measurements require
that there ...
It cannot be employed with ferrous materials, however, since it will cause
fluorescent radiation from the iron in the specimen; instead, Co Ko, Fe Ko or Cr
Ko, radiation should be used. Precise lattice-parameter measurements require
that there ...
Page 167
the intensity of some of the short wavelengths which cause fluorescence, but it
will not, of course, eliminate them completely, particularly in the wavelength
region near 0.6A, where the intensity of the continuous spectrum is high and the ...
the intensity of some of the short wavelengths which cause fluorescence, but it
will not, of course, eliminate them completely, particularly in the wavelength
region near 0.6A, where the intensity of the continuous spectrum is high and the ...
Page 398
(Knowledge of the quartz con- - tent is important in industrial health IF 4H.
programs, because inhaled quartz or other siliceous material is the cause of the
lung disease known as silicosis.) In this analysis, fluorite (CaF2) has been found
to be a ...
(Knowledge of the quartz con- - tent is important in industrial health IF 4H.
programs, because inhaled quartz or other siliceous material is the cause of the
lung disease known as silicosis.) In this analysis, fluorite (CaF2) has been found
to be a ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |