## Elements of X-Ray Diffraction |

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Page 218

OC Vain n/ \CF cos y) \ am - tan S sin n cos •> With these equations, the position (

in terms of x and y) of any diffraction spot can be plotted for given values of y and

S and any desired specimen- film distance D. The result is the Greninger

OC Vain n/ \CF cos y) \ am - tan S sin n cos •> With these equations, the position (

in terms of x and y) of any diffraction spot can be plotted for given values of y and

S and any desired specimen- film distance D. The result is the Greninger

**chart**, ...Page 225

There are alternate ways of manipulating both the Greninger

stereographic projection, and the particular method used is purely a matter of

personal preference. For example, we may ignore the individual spots on the film

and ...

There are alternate ways of manipulating both the Greninger

**chart**and thestereographic projection, and the particular method used is purely a matter of

personal preference. For example, we may ignore the individual spots on the film

and ...

Page 307

paper strip is then placed on the

horizontally, until a position is found where each mark on the strip coincides with

a line on the

various ...

paper strip is then placed on the

**chart**and moved about, both vertically andhorizontally, until a position is found where each mark on the strip coincides with

a line on the

**chart**. Vertical and horizontal movements correspond to tryingvarious ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone