Elements of X-ray Diffraction |
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Page 347
... composition of the alloy produces a change in the relative amounts of the two phases but no change in their compositions . These compositions are fixed at the intersections of a horizontal " tie line " with the boundaries of the two ...
... composition of the alloy produces a change in the relative amounts of the two phases but no change in their compositions . These compositions are fixed at the intersections of a horizontal " tie line " with the boundaries of the two ...
Page 356
... composition of the alloy , and this rapid variation of Wa / Ws will enable the phase boundary to be fixed quite precisely . This is true , for the x - ray method , even if the atomic numbers of A and B are widely different , because ...
... composition of the alloy , and this rapid variation of Wa / Ws will enable the phase boundary to be fixed quite precisely . This is true , for the x - ray method , even if the atomic numbers of A and B are widely different , because ...
Page 361
... composition curve would then look like Fig . 12-11 ( b ) , since the composition and parameter of a in alloys along bc is constant . However , we do not generally know the direction of the line bc at this stage , because tie lines ...
... composition curve would then look like Fig . 12-11 ( b ) , since the composition and parameter of a in alloys along bc is constant . However , we do not generally know the direction of the line bc at this stage , because tie lines ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone