Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 5
6 5 Ko: J' characteristic radiation o Continuous / 25 kV N radiation K8 o 7 2 / N
SWL | / 0 0 1.0 2.0 WAVELENGTH (angstroms) 15—o ~~ 2Tox s s 0 Fig. 1–4. X-
ray spectrum of molybdenum as a function of applied voltage (schematic).
6 5 Ko: J' characteristic radiation o Continuous / 25 kV N radiation K8 o 7 2 / N
SWL | / 0 0 1.0 2.0 WAVELENGTH (angstroms) 15—o ~~ 2Tox s s 0 Fig. 1–4. X-
ray spectrum of molybdenum as a function of applied voltage (schematic).
Page 7
An increase in voltage above the critical voltage increases the intensities of the
characteristic lines relative to the continuous spectrum but does not change their
wavelengths. Figure 1–5 shows the spectrum of molybdenum at 35 kV on a ...
An increase in voltage above the critical voltage increases the intensities of the
characteristic lines relative to the continuous spectrum but does not change their
wavelengths. Figure 1–5 shows the spectrum of molybdenum at 35 kV on a ...
Page 167
the intensity of some of the short wavelengths which cause fluorescence, but it
will not, of course, eliminate them completely, particularly in the wavelength
region near 0.6A, where the intensity of the continuous spectrum is high and the ...
the intensity of some of the short wavelengths which cause fluorescence, but it
will not, of course, eliminate them completely, particularly in the wavelength
region near 0.6A, where the intensity of the continuous spectrum is high and the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |