Elements of X-ray Diffraction |
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Page 329
... cos2 0 , ( 11-11 ) where K is a constant . Accordingly , we have the important result that the fractional errors in d are directly proportional to cos2 0 , and therefore approach zero as cos2 approaches zero or as approaches 90 ° . In ...
... cos2 0 , ( 11-11 ) where K is a constant . Accordingly , we have the important result that the fractional errors in d are directly proportional to cos2 0 , and therefore approach zero as cos2 approaches zero or as approaches 90 ° . In ...
Page 330
... cos2 ( or sin2 ) , and either will give satisfactory results . If the various sources of error , particularly absorption , are analyzed more rigorously than we have done here , it can be shown that the relation cas2 6 ) Ad d = K cos2 0 cos2 ...
... cos2 ( or sin2 ) , and either will give satisfactory results . If the various sources of error , particularly absorption , are analyzed more rigorously than we have done here , it can be shown that the relation cas2 6 ) Ad d = K cos2 0 cos2 ...
Page 331
... cos2 0/0 ) and not against cos2 0. And if there are no lines of the type hk0 and 001 with greater than 80 ° , even the former function will not assure an accu- rate extrapolation . A better but more laborious method , and one which ...
... cos2 0/0 ) and not against cos2 0. And if there are no lines of the type hk0 and 001 with greater than 80 ° , even the former function will not assure an accu- rate extrapolation . A better but more laborious method , and one which ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone