Elements of X-ray Diffraction |
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Page 193
... counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is exposed to a beam of x - rays ...
... counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is exposed to a beam of x - rays ...
Page 194
... counter and that of a proportional counter : ( 1 ) The absorption of an x - ray quantum anywhere within the volume of a Geiger counter triggers an avalanche that extends over the whole length of the counter . ( 2 ) The gas amplification ...
... counter and that of a proportional counter : ( 1 ) The absorption of an x - ray quantum anywhere within the volume of a Geiger counter triggers an avalanche that extends over the whole length of the counter . ( 2 ) The gas amplification ...
Page 200
... counter and its associated circuits is given by the product of two efficiencies , that of quantum ab- sorption and that of quantum detection . The ... counters . This type of counter utilizes the 200 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
... counter and its associated circuits is given by the product of two efficiencies , that of quantum ab- sorption and that of quantum detection . The ... counters . This type of counter utilizes the 200 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone