Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 197
The effect of counting rate on counting losses (schematic). Since the resolving
time of the ordinary Geiger counter is of the order of 107* sec, counting-rate
curves should be linear up to about 10,000 cps (counts per second) if the arrival
of ...
The effect of counting rate on counting losses (schematic). Since the resolving
time of the ordinary Geiger counter is of the order of 107* sec, counting-rate
curves should be linear up to about 10,000 cps (counts per second) if the arrival
of ...
Page 208
Even when the x-ray intensity is constant (constant average counting rate), the
spacing of the counter pulses is random in time, which means that the counting
rate actually varies with time over short periods. The ratemeter responds to these
...
Even when the x-ray intensity is constant (constant average counting rate), the
spacing of the counter pulses is random in time, which means that the counting
rate actually varies with time over short periods. The ratemeter responds to these
...
Page 209
average counting rate TIME Fig. 7–22. Effect of time constant (T.C.) on recorded
fluctuations in counting rate at constant x-ray intensity (schematic). Time
constants changed abruptly at times shown. (T.C.)1 < (T.C.)2 < (T.C.)3. tion
pattern can be ...
average counting rate TIME Fig. 7–22. Effect of time constant (T.C.) on recorded
fluctuations in counting rate at constant x-ray intensity (schematic). Time
constants changed abruptly at times shown. (T.C.)1 < (T.C.)2 < (T.C.)3. tion
pattern can be ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |