Elements of X-ray Diffraction |
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Page 197
... counting loss multichamber Geiger counter 4000 5000 QUANTA ABSORBED PER SECOND FIG . 7-14 . The effect of counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec ...
... counting loss multichamber Geiger counter 4000 5000 QUANTA ABSORBED PER SECOND FIG . 7-14 . The effect of counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec ...
Page 208
... counting rate ) , the spacing of the counter pulses is random in time , which means that the counting rate actually varies with time over short periods . The ratemeter responds to these statistical fluctuations in the counting rate ...
... counting rate ) , the spacing of the counter pulses is random in time , which means that the counting rate actually varies with time over short periods . The ratemeter responds to these statistical fluctuations in the counting rate ...
Page 209
Bernard Dennis Cullity. LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 . - ( T.C. ) 2- - ( T.C. ) 3- average counting rate TIME FIG . 7-22 . Effect of time constant ( T.C. ) on recorded fluctuations in counting rate at constant x - ray ...
Bernard Dennis Cullity. LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 . - ( T.C. ) 2- - ( T.C. ) 3- average counting rate TIME FIG . 7-22 . Effect of time constant ( T.C. ) on recorded fluctuations in counting rate at constant x - ray ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone