Elements of X-ray Diffraction |
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Page 197
... counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec , counting - rate curves should be linear up to about 10,000 cps ( counts per second ) if the arrival of ...
... counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec , counting - rate curves should be linear up to about 10,000 cps ( counts per second ) if the arrival of ...
Page 208
... count is being made with a scaler will go entirely undetected . It is this feature of a ratemeter which is so useful in diffractometry . A diffrac- LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 208 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
... count is being made with a scaler will go entirely undetected . It is this feature of a ratemeter which is so useful in diffractometry . A diffrac- LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 208 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
Page 209
Bernard Dennis Cullity. LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 . - ( T.C. ) 2- - ( T.C. ) 3- average counting rate TIME FIG . 7-22 . Effect of time constant ( T.C. ) on recorded fluctuations in counting rate at constant x - ray ...
Bernard Dennis Cullity. LOG COUNTING RATE COUNTING RATE · ( T.C. ) 1 . - ( T.C. ) 2- - ( T.C. ) 3- average counting rate TIME FIG . 7-22 . Effect of time constant ( T.C. ) on recorded fluctuations in counting rate at constant x - ray ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone