Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 88
Page 242
... crystal of unknown structure is an indication of the kind of symmetry possessed by that crystal . Thus the Laue method can be used as an aid in the determination of crystal structure . ) There is another method of setting a crystal in a ...
... crystal of unknown structure is an indication of the kind of symmetry possessed by that crystal . Thus the Laue method can be used as an aid in the determination of crystal structure . ) There is another method of setting a crystal in a ...
Page 409
... crystal , a shielded sample box , and a different Soller slit . The main features of a spectrometer employing a curved transmitting crystal are shown in Fig . 15-5 . The crystal is usually mica , which is easily obtainable in the form ...
... crystal , a shielded sample box , and a different Soller slit . The main features of a spectrometer employing a curved transmitting crystal are shown in Fig . 15-5 . The crystal is usually mica , which is easily obtainable in the form ...
Page 412
... crystal and partly on the perfection of the crystal itself . The beam re- flected by the crystal into the counter is fairly wide , in a linear sense , but almost parallel ; its angular width is measured by its divergence , and this is ...
... crystal and partly on the perfection of the crystal itself . The beam re- flected by the crystal into the counter is fairly wide , in a linear sense , but almost parallel ; its angular width is measured by its divergence , and this is ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone