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Results 1-3 of 83
Page 356
12–5 Determination of solvus curves (parametric method). As we have just seen,
... The lattice parameter of a is measured for each alloy and plotted against alloy
composition, resulting in a curve such as that shown in Fig. 12–8(b). This curve ...
12–5 Determination of solvus curves (parametric method). As we have just seen,
... The lattice parameter of a is measured for each alloy and plotted against alloy
composition, resulting in a curve such as that shown in Fig. 12–8(b). This curve ...
Page 357
the parameter curve. In this way, we have located one point on the solvus curve,
namely a percent B at T1. Other points could be found in a similar manner. For
example, if the same series of alloys were equilibrated at temperature T2, ...
the parameter curve. In this way, we have located one point on the solvus curve,
namely a percent B at T1. Other points could be found in a similar manner. For
example, if the same series of alloys were equilibrated at temperature T2, ...
Page 451
The corrected working curve is therefore a line of the same slope as the
experimental curve but shifted by an amount (A20)0. The working curve may or
may not pass through zero, depending on whether or not the cali- – - O brating
member ...
The corrected working curve is therefore a line of the same slope as the
experimental curve but shifted by an amount (A20)0. The working curve may or
may not pass through zero, depending on whether or not the cali- – - O brating
member ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray