Elements of X-ray Diffraction |
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Page 110
... decreases as the quantity ( sin ) / λ increases . fcu 20 10 0 0.2 0.4 0.6 0.8 1.0 sin @ ( A - 1 ) Calculated values of ƒ for various atoms and various values of ( sin ) / A are tabulated in Appendix 8 , and a curve showing the typical ...
... decreases as the quantity ( sin ) / λ increases . fcu 20 10 0 0.2 0.4 0.6 0.8 1.0 sin @ ( A - 1 ) Calculated values of ƒ for various atoms and various values of ( sin ) / A are tabulated in Appendix 8 , and a curve showing the typical ...
Page 130
... decreases as the linear absorption coefficient of the specimen decreases , but the absorption is always greater for the low - 0 reflections . ( These remarks apply only to the cylindrical specimen used in the Debye - Scherrer method ...
... decreases as the linear absorption coefficient of the specimen decreases , but the absorption is always greater for the low - 0 reflections . ( These remarks apply only to the cylindrical specimen used in the Debye - Scherrer method ...
Page 367
... decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines by partial disorder is illustrated in Fig . 13-3 . By comparing the integrated ...
... decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines by partial disorder is illustrated in Fig . 13-3 . By comparing the integrated ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone