Elements of X-ray Diffraction |
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Page 7
... depends on atomic number but averages about 5/1 . These characteristic lines may be seen in the uppermost curve of Fig . 1-4 . Since the critical K excitation voltage , i.e. , the voltage necessary to excite K characteristic radiation ...
... depends on atomic number but averages about 5/1 . These characteristic lines may be seen in the uppermost curve of Fig . 1-4 . Since the critical K excitation voltage , i.e. , the voltage necessary to excite K characteristic radiation ...
Page 125
... depends on the particular value of 0 involved , even though all other variables are held constant . We can find this dependence by considering , separately , two aspects of the diffrac- tion curve : the maximum intensity and the breadth ...
... depends on the particular value of 0 involved , even though all other variables are held constant . We can find this dependence by considering , separately , two aspects of the diffrac- tion curve : the maximum intensity and the breadth ...
Page 355
... depends on having several experimental points close to the phase boundary which is being determined . The accuracy of the disappearing - phase method is therefore governed by the sensitivity of the x - ray method in detecting small ...
... depends on having several experimental points close to the phase boundary which is being determined . The accuracy of the disappearing - phase method is therefore governed by the sensitivity of the x - ray method in detecting small ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone