Elements of X-ray Diffraction |
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Page v
... described in terms of metals and alloys . However , little or no modification of experimental method is required for the examination of nonmetallic materials , inasmuch as the physical principles involved do not depend on the material ...
... described in terms of metals and alloys . However , little or no modification of experimental method is required for the examination of nonmetallic materials , inasmuch as the physical principles involved do not depend on the material ...
Page 391
... described in succeeding sections . It is worth noting that all these methods of analysis have one essential feature in common : the measurement of the concentration of a particular phase depends on the measurement of the ratio of the ...
... described in succeeding sections . It is worth noting that all these methods of analysis have one essential feature in common : the measurement of the concentration of a particular phase depends on the measurement of the ratio of the ...
Page 455
... described . Unusual fea- tures include a full description of the use of focusing monochromators and chapters on small - angle scattering and diffraction by amorphous substances . Crystal - structure determination is not included . ( 3 ) ...
... described . Unusual fea- tures include a full description of the use of focusing monochromators and chapters on small - angle scattering and diffraction by amorphous substances . Crystal - structure determination is not included . ( 3 ) ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone