Elements of X-ray Diffraction |
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Page 23
... Detection of x - rays . The principal means used to detect x - ray beams are fluorescent screens , photographic film , and ... detector of x - rays . per than to the K radiation from molybdenum , other 1-8 ] 223 DETECTION OF X - RAYS.
... Detection of x - rays . The principal means used to detect x - ray beams are fluorescent screens , photographic film , and ... detector of x - rays . per than to the K radiation from molybdenum , other 1-8 ] 223 DETECTION OF X - RAYS.
Page 407
... detection of light elements is absorption in the sample itself . Fluorescent radiation is produced not only at the surface of the sample but also in its interior , to a depth depending on the depth of effective penetration by the ...
... detection of light elements is absorption in the sample itself . Fluorescent radiation is produced not only at the surface of the sample but also in its interior , to a depth depending on the depth of effective penetration by the ...
Page 414
... detection of heavy elements by their fluorescent K lines having wavelengths below 0.5A . Counter speed is another important factor in quantitative analysis , be- cause a counter which can operate at high counting rates without losses ...
... detection of heavy elements by their fluorescent K lines having wavelengths below 0.5A . Counter speed is another important factor in quantitative analysis , be- cause a counter which can operate at high counting rates without losses ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone