Elements of X-ray Diffraction |
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Page 299
... diffraction lines are to have any meaning in terms of crystal structure . After the pattern is obtained , the value of sin2 is calculated for each diffraction line ; this set of sin values is the raw material for the determination of ...
... diffraction lines are to have any meaning in terms of crystal structure . After the pattern is obtained , the value of sin2 is calculated for each diffraction line ; this set of sin values is the raw material for the determination of ...
Page 350
... diffraction patterns , or where it is suspected that lines due to K8 radiation may be present in some patterns and not in others . It is important to remember that a diffraction pattern of a given phase is characterized not only by line ...
... diffraction patterns , or where it is suspected that lines due to K8 radiation may be present in some patterns and not in others . It is important to remember that a diffraction pattern of a given phase is characterized not only by line ...
Page 447
... diffraction line occur at the same position 20 , since the correction itself ... diffraction line which is both shifted and broadened . This effect occurs ... lines are sharp , it is relatively easy to measure this shift visually with ...
... diffraction line occur at the same position 20 , since the correction itself ... diffraction line which is both shifted and broadened . This effect occurs ... lines are sharp , it is relatively easy to measure this shift visually with ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone