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Page 262
All diffraction lines have a measurable breadth, even when the crystal size
exceeds 1000A, due to such causes as ... problem in determining particle size
from line breadths is to determine B from the measured breadth BM of the
diffraction line.
All diffraction lines have a measurable breadth, even when the crystal size
exceeds 1000A, due to such causes as ... problem in determining particle size
from line breadths is to determine B from the measured breadth BM of the
diffraction line.
Page 299
The powder pattern of the unknown is obtained with a Debye–Scherrer camera
or a diffractometer, the object being to cover as wide an angular range of 26 as
possible. A camera such as the Seemann-Bohlin, which records diffraction lines ...
The powder pattern of the unknown is obtained with a Debye–Scherrer camera
or a diffractometer, the object being to cover as wide an angular range of 26 as
possible. A camera such as the Seemann-Bohlin, which records diffraction lines ...
Page 350
It is important to remember that a diffraction pattern of a given phase is
characterized not only by line positions but also ... This means that the presence
of phase X in a mixture of phases cannot be proved merely by coincidence of the
lines of ...
It is important to remember that a diffraction pattern of a given phase is
characterized not only by line positions but also ... This means that the presence
of phase X in a mixture of phases cannot be proved merely by coincidence of the
lines of ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |