Elements of X-Ray Diffraction |
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Page 262
3-7, crystals in this size range cause broadening of the Debye rings, the extent of
the broadening being given by Eq. (3-13) : 0.9X B = -- (3-13) toot 6 where B =
broadening of diffraction line measured at half its maximum intensity (radians)
and t ...
3-7, crystals in this size range cause broadening of the Debye rings, the extent of
the broadening being given by Eq. (3-13) : 0.9X B = -- (3-13) toot 6 where B =
broadening of diffraction line measured at half its maximum intensity (radians)
and t ...
Page 350
This may be difficult in some alloy systems where the phases involved have
complex diffraction patterns, or where it is suspected that lines due to K()
radiation may be present in some patterns and not in others. It is important to
remember that ...
This may be difficult in some alloy systems where the phases involved have
complex diffraction patterns, or where it is suspected that lines due to K()
radiation may be present in some patterns and not in others. It is important to
remember that ...
Page 447
The powder should have the same composition as the material in which stress is
to be measured in order that its diffraction line occur at the same position 26,
since the correction itself, (A20)0, depends on 26. 17-7 Superimposed
macrostress ...
The powder should have the same composition as the material in which stress is
to be measured in order that its diffraction line occur at the same position 26,
since the correction itself, (A20)0, depends on 26. 17-7 Superimposed
macrostress ...
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Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-Ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials engineering |
| Author | Bernard Dennis Cullity |
| Publisher | Addison-Wesley Publishing Company, 1959 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |