Elements of X-ray Diffraction |
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Page 142
... diffraction spots and the background , since the coherent scattering , which ... spot may be increased by means of an intensifying screen , as used in ... diffracted beam emulsion film base active side of screen FIG . 5-5 . Arrangement of ...
... diffraction spots and the background , since the coherent scattering , which ... spot may be increased by means of an intensifying screen , as used in ... diffracted beam emulsion film base active side of screen FIG . 5-5 . Arrangement of ...
Page 216
... spots on the film . If we wished , we could determine the Bragg angle e corresponding to each Laue spot from Eq . ( 5-2 ) , but that would be no help in identifying the planes producing that spot , since the wavelength of the diffracted ...
... spots on the film . If we wished , we could determine the Bragg angle e corresponding to each Laue spot from Eq . ( 5-2 ) , but that would be no help in identifying the planes producing that spot , since the wavelength of the diffracted ...
Page 218
... diffraction spot can be plotted for given values of y and 8 and any desired specimen- film distance D. The result is ... diffraction spots from planes of a zone whose axis is tilted away from the plane of the film by the indicated angle ...
... diffraction spot can be plotted for given values of y and 8 and any desired specimen- film distance D. The result is ... diffraction spots from planes of a zone whose axis is tilted away from the plane of the film by the indicated angle ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone