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Page 184
If not enough powder is available for a flat specimen, a thin-rod specimen of the
kind used in Debye-Scherrer cameras may be used; it is mounted on the
diffractometer axis and continuously rotated by a small motor (see Fig. 7–3).
However ...
If not enough powder is available for a flat specimen, a thin-rod specimen of the
kind used in Debye-Scherrer cameras may be used; it is mounted on the
diffractometer axis and continuously rotated by a small motor (see Fig. 7–3).
However ...
Page 237
8–4 Diffractometer method. Still another method of determining crystal orientation
involves the use of the diffractometer and a procedure radically different from that
of either Laue method. With the essentially monochromatic radiation used in ...
8–4 Diffractometer method. Still another method of determining crystal orientation
involves the use of the diffractometer and a procedure radically different from that
of either Laue method. With the essentially monochromatic radiation used in ...
Page 334
11–5 Diffractometers. The commercial diffractometer is a rather new instrument
and relatively little use has been made of it for the precise measurement of lattice
parameters. For that reason, no generally valid procedure for use in such ...
11–5 Diffractometers. The commercial diffractometer is a rather new instrument
and relatively little use has been made of it for the precise measurement of lattice
parameters. For that reason, no generally valid procedure for use in such ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |